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Circuits

By Steven H. Voldman

With the evolution of semiconductor expertise and worldwide diversification of the semiconductor company, checking out of semiconductor units to structures for electrostatic discharge (ESD) and electric overstress (EOS) has elevated in importance.

ESD checking out: From parts to Systems updates the reader within the new exams, try types, and strategies within the characterization of semiconductor elements for ESD, EOS, and latchup. 

Key features:

  • Provides realizing and information of ESD versions and requirements together with human physique version (HBM), laptop version (MM), charged gadget version (CDM), charged board version (CBM), cable discharge occasions (CDE), human steel version (HMM), IEC 61000-4-2 and IEC 61000-4-5.
  • Discusses new trying out methodologies comparable to transmission line pulse (TLP), to very speedy transmission line pulse (VF-TLP), and destiny equipment of lengthy pulse TLP, to ultra-fast TLP (UF-TLP).
  • Describes either traditional trying out and new checking out concepts for either chip and method point evaluation.
  • Addresses EOS trying out, electromagnetic compatibility (EMC) scanning, to present reconstruction methods.
  • Discusses latchup characterization and checking out methodologies for assessment of semiconductor expertise to product testing. 

ESD checking out: From parts to Systems is a part of the authors’ sequence of books on electrostatic discharge (ESD) defense; this publication might be a useful reference for the pro semiconductor chip and system-level ESD and EOS try engineer. Semiconductor machine and technique improvement, circuit designers, caliber, reliability and failure research engineers also will locate it an important reference.  furthermore, its educational therapy will attract either senior and graduate scholars with pursuits in semiconductor strategy, machine physics, semiconductor checking out and experimental work.

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