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By J. C. Zhang, M. A. Styblinski (auth.)

Traditionally, desktop Aided layout (CAD) instruments were used to create the nominal layout of an built-in circuit (IC), such that the circuit nominal reaction meets the specified functionality standards. in fact, besides the fact that, a result of disturbances ofthe IC production procedure, the particular performancesof the mass produced chips are diversified than these for the nominal layout. whether the producing technique have been tightly managed, in order that there have been little diversifications around the chips synthetic, the environmentalchanges (e. g. these oftemperature, offer voltages, and so on. ) might alsomakethe circuit performances differ in the course of the circuit lifestyles span. Process-related functionality diversifications could lead on to low production yield, and unacceptable product caliber. For those purposes, statistical circuit layout concepts are required to layout the circuit parameters, taking the statistical approach diversifications under consideration. This ebook offers with a few theoretical and sensible facets of IC statistical layout, and emphasizes how they range from these for discrete circuits. It de­ scribes a spectrum of alternative statistical layout difficulties, reminiscent of parametric yield optimization, generalized on-target layout, variability minimization, according to­ formance tunning, and worst-case layout. the most emphasis of the presen­ tation is put on the rules and functional suggestions for functionality vari­ skill minimization. it truly is was hoping that the booklet may possibly function an introductory reference fabric for varied teams of IC designers, and the methodologies defined can assist them improve the circuit caliber and manufacturability. The publication containsseven chapters.

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